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XRF
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b456f75c
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b456f75c
authored
1 year ago
by
Milan Prica
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XRF_beamline.md
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@@ -5,30 +5,8 @@ Ref. (SPE): Milan Prica, Roberto Borghes, Valentina Chenda
Ref. (XRF): https://www.elettra.eu/lightsources/elettra/elettra-beamlines/microfluorescence/de.html
## Experimental Activities
XRF beamline is developed by Elettra Sincrotrone Trieste and operated in partnership
with the International Atomic Energy Agency (IAEA).
X-Ray Fluorescence is a versatile technique which can investigate solids, liquids,
artworks, air particulates, inks, etc… It provides information on the elemental
composition of a sample.
At the XRF beamline, experiments can be carried out under ambient conditions or in
the ultrahigh vacuum (UHV) endstation, where the pressures can be lowered down to 10-9mbar.
The UHV endstation is equipped with a 7-axes manipulator to adjust the
sample orientation with respect to the X-ray beam and/or the detectors.
Available techniques
-
2D XRF and XANES: quantitative chemical analysis over different areas of the sample;
-
Grazing Incidence XRF and XANES: ideal for nano-layered structures or shallow dopants
in semiconductors with nm depth resolution.
-
Total Reflection XRF and XANES: for ultra-trace elemental/chemical characterization of
liquid samples residues and micro/nanoparticles on smooth surfaces;
-
X-Ray Reflectivity (XRR): for structural analysis of thin films and multi-layers.
There is extensive user documentation on the Elettra website written by the beamline scientist, Ilaria Carlomagno.
Extensive documentation describing the beamline and the data acquisition tools is provided by the
beamline scientist, Ilaria Carlomagno on the Elettra XRF website.
https://www.elettra.eu/lightsources/elettra/elettra-beamlines/microfluorescence/useful-procedures.html
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